Title of article
Crystal Orientation Measured by XRD and Annotation of the Butterfly Diagram
Author/Authors
Guo، نويسنده , , Zhenqi and Fu، نويسنده , , Tao and Fu، نويسنده , , Hengzhi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
4
From page
431
To page
434
Abstract
An improved X-ray diffraction rotating orientation measurement method is proposed that can measure the crystal lattice orientation quickly and accurately. The method can also directly assess the quality of preferentially oriented specimens and quasi-single crystals through use of the butterfly diagram to measure the crystal orientation distribution.
Journal title
Materials Characterization
Serial Year
2000
Journal title
Materials Characterization
Record number
2270446
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