Title of article
Quantitative complex electrical impedance microscopy by scanning evanescent microwave microscope
Author/Authors
Xiang، نويسنده , , X.-D. and Gao، نويسنده , , C.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
9
From page
117
To page
125
Abstract
Quantitative electrical impedance microscopy has been recently achieved using the scanning evanescent microwave microscope with the help of analytical solution of near-field interactions. The historical perspectives and fundamental physics involved in this field are reviewed. The experimental techniques and theoretical approach are discussed in detail.
Keywords
Scanning probe microscopy , Evanescent microwave probe , Electrical impedance microscopy
Journal title
Materials Characterization
Serial Year
2002
Journal title
Materials Characterization
Record number
2270481
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