Neutron and X-ray reflectometry of interfacial systems in colloid and polymer chemistry

Neutron and X-ray specular reflectometry have been applied recently to the study of the structure of a range of different interfacial systems relevant to colloid chemistry. These include surfactants and surfactant mixtures at air/liquid, liquid/liquid and solid/liquid interfaces, insoluble monolayers, polymers adsorbed from solution, and polymer thin films.