Effect of induced damage on hydrogen isotope retention of F82H with impurity layer

The effects of induced damage on hydrogen isotope retention in F82H with or without thermal oxidation were investigated using thermal desorption spectroscopy. To induce damage and modify the surface, glow discharge pre-irradiated Ar+ ions was examined. In non-oxidized samples, the amount of desorbed deuterium increased with Ar+ ion fluence. Oxygen depletion in the surface layer of non-oxidized samples from the Ar+ ion irradiation, which resulted in bulk diffusion of deuterium, is responsible for the increase in deuterium retention. A comparison between non-oxidized and oxidized samples clearly indicated that the surface oxide layer greatly influenced deuterium retention/desorption behaviors of F82H.