Title of article
A quantile–quantile plot based pattern matching for defect detection
Author/Authors
Du-Ming Tsai، نويسنده , , Cheng-Hsiang Yang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
15
From page
1948
To page
1962
Keywords
Defect detection , Pattern matching , Similarity measure , Quantile–quantile plot
Journal title
PATTERN RECOGNITION LETTERS
Serial Year
2005
Journal title
PATTERN RECOGNITION LETTERS
Record number
251167
Link To Document