Substrate Temperature Effect on the Structural and Electrical Properties of SnS Thin Films using prepared Chemical Spray Technique

In this research, The effect of substrate temperature was studied at different temperatures 250, 350 and 450 ⁰C. Structural properties of the films were determined using X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM). The X-ray diffraction results showed that all the prepared films were polycrystalline, orthorhombic in structure, and a preferred orientation (301),(602) and (111) . The crystallinity of the thin film (SnS) increases with the increase in the temperature (substrate). The electrical properties showed all thin films p-type and D.C conductivity measurements showed that the conductivity increased with increasing temperatures and I-V characteristics were also studied under dark.