Title of article
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes
Author/Authors
Tanay Karnik، نويسنده , , IEEE Peter Hazucha، نويسنده , , IEEE Jagdish Patel ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
16
From page
128
To page
143
Keywords
High Performance , error tolerance , Reliability , soft error , single event upset
Journal title
I E E E Transactions on Dependable and Secure Computing
Serial Year
2004
Journal title
I E E E Transactions on Dependable and Secure Computing
Record number
289436
Link To Document