Title of article
CD-R groove measurement by phase stepping interferometry
Author/Authors
Sainov، V. نويسنده , , Mechkarov، N. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
-428
From page
429
To page
0
Abstract
The interferometric CD-R groove measurements in transmission and reflection mode with HeNe and Ar+ lasers are presented. The phase micro-inhomogeneities on the surface relief of polycarbonate substrates are compared with the surface relief of a stamping onto copper layer metal master for rainbow holograms, used as a test object. The grid density of the test object is about 60% higher than the density of the CD-R groove at a similar relief depth. The reason for the phase inhomogeneities is due to the refractive index variations of the polymer substrate. The RMS of the measurements is not higher than 0.1rad.
Keywords
Optical second harmonic generation , Amorphous thin films , Silicon oxinitride , Non-linear optical method of investigations
Journal title
OPTICS & LASERS IN ENGINEERING
Serial Year
2001
Journal title
OPTICS & LASERS IN ENGINEERING
Record number
30271
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