• Title of article

    CD-R groove measurement by phase stepping interferometry

  • Author/Authors

    Sainov، V. نويسنده , , Mechkarov، N. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    -428
  • From page
    429
  • To page
    0
  • Abstract
    The interferometric CD-R groove measurements in transmission and reflection mode with HeNe and Ar+ lasers are presented. The phase micro-inhomogeneities on the surface relief of polycarbonate substrates are compared with the surface relief of a stamping onto copper layer metal master for rainbow holograms, used as a test object. The grid density of the test object is about 60% higher than the density of the CD-R groove at a similar relief depth. The reason for the phase inhomogeneities is due to the refractive index variations of the polymer substrate. The RMS of the measurements is not higher than 0.1rad.
  • Keywords
    Optical second harmonic generation , Amorphous thin films , Silicon oxinitride , Non-linear optical method of investigations
  • Journal title
    OPTICS & LASERS IN ENGINEERING
  • Serial Year
    2001
  • Journal title
    OPTICS & LASERS IN ENGINEERING
  • Record number

    30271