• Title of article

    High-resolution x-ray scattering measurements: 1. Surfaces

  • Author/Authors

    Daillant، J نويسنده , , Albai، M نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    -1724
  • From page
    1725
  • To page
    0
  • Abstract
    X-ray scattering investigations of surfaces and interfaces in soft-condensed matter are reviewed. Both high-resolution structural determinations in the direct space and investigations of fluctuations with long-range correlations requiring a high resolution in the Fourier space are discussed. All the scattering cross-sections for diffraction or diffuse scattering are derived within a unified frame, and the experimental aspects related to their measurement are discussed in detail. The general principles are illustrated by various examples of studies of the liquidvapour interface, Langmuir and Langmuir-Blodgett films, wetting films, polymer films, liquid crystals and liquid-liquid interfaces.
  • Keywords
    Quantum Lattice Systems , Ground State Euclidean Measures , Cluster Expansions , Uniqueness Problem
  • Journal title
    REPORTS ON PROSGRESS IN PHYSICS JOURNAL
  • Serial Year
    2000
  • Journal title
    REPORTS ON PROSGRESS IN PHYSICS JOURNAL
  • Record number

    31714