• Title of article

    In-process roughness measurement on moving surfaces

  • Author/Authors

    Wong، P. L. نويسنده , , Li، K. Y. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    -542
  • From page
    543
  • To page
    0
  • Abstract
    A new optical technique, which utilises the combined effects of interference and light scattering, was developed for surface roughness measurements. This paper presents the technique applicable to extracting the roughness of moving surfaces under high rotational speeds up to 3.7 m/s. The applicability of the technique to in-process roughness measurement was demonstrated with a cylindrical grinding process.
  • Keywords
    Relative gap , Evanescent switching , Frustrated total internal reflection
  • Journal title
    OPTICS & LASER TECHNOLOGY
  • Serial Year
    1999
  • Journal title
    OPTICS & LASER TECHNOLOGY
  • Record number

    31877