Title of article
In-process roughness measurement on moving surfaces
Author/Authors
Wong، P. L. نويسنده , , Li، K. Y. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-542
From page
543
To page
0
Abstract
A new optical technique, which utilises the combined effects of interference and light scattering, was developed for surface roughness measurements. This paper presents the technique applicable to extracting the roughness of moving surfaces under high rotational speeds up to 3.7 m/s. The applicability of the technique to in-process roughness measurement was demonstrated with a cylindrical grinding process.
Keywords
Relative gap , Evanescent switching , Frustrated total internal reflection
Journal title
OPTICS & LASER TECHNOLOGY
Serial Year
1999
Journal title
OPTICS & LASER TECHNOLOGY
Record number
31877
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