• Title of article

    Laser diode interferometer used for measuring displacements in large range with a nanometer accuracy

  • Author/Authors

    Qian، Feng نويسنده , , Wang، Xuefeng نويسنده , , Wang، Xiangzhao نويسنده , , Lu، Hongbin نويسنده , , Bu، Yang نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    -218
  • From page
    219
  • To page
    0
  • Abstract
    In this paper, the displacement of an object is measured with a photothermal phasemodulating laser diode interferometer. A feedback control system is designed to reduce the measurement errors caused by the fluctuations in the optical wavelength of the laser diode and the vibrations of the optical components in the interferometer. A new method is proposed to enlarge the measuring range of displacement. Using this method, the measuring range is enlarged from half wavelength to nearly 125 mu m and the measurement accuracy is about 1 nm. The simulation and experimental results have shown the usefulness of the method and the feedback control system.
  • Keywords
    Slit-scanning method , M2 factor measurement
  • Journal title
    OPTICS & LASER TECHNOLOGY
  • Serial Year
    2001
  • Journal title
    OPTICS & LASER TECHNOLOGY
  • Record number

    31920