Title of article
Characterization and Modeling of Parasitic Emission in Deep Submicron CMOS.
Author/Authors
B. Vrignon، نويسنده , , S. D. Bendhia، نويسنده , , E. Lamoureux، نويسنده , , E. Sicard، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
6
From page
382
To page
387
Keywords
electromagnetic interference(EMI) modeling , electromagnetic compatability (EMC) , Complementary metal–oxide semiconductor (CMOS)technology , on-chip sampling.
Journal title
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Serial Year
2005
Journal title
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Record number
341538
Link To Document