• Title of article

    Semi-direct method for surface structure analysis using correlated thermal diffuse scattering

  • Author/Authors

    T. Abukawa، نويسنده , , S. Kono، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    33
  • From page
    19
  • To page
    51
  • Keywords
    Semiconductor , Electron diffraction , Silicon , Thermal diffuse scattering , Surface structure
  • Journal title
    Progress in Surface Science
  • Serial Year
    2003
  • Journal title
    Progress in Surface Science
  • Record number

    342831

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=342831