Title of article
Nanoscale EELS analysis of dielectric function and bandgap properties in GaN and related materials
Author/Authors
G. Brockt ، نويسنده , , H. Lakner، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
435
To page
440
Keywords
Electron Energy Loss Spectroscopy , Scanning transmission electron microscope , Reflectivity , GaN , ALN , Dielectric function
Journal title
Micron
Serial Year
2000
Journal title
Micron
Record number
356860
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