• Title of article

    Structure and mass analysis by scanning transmission electron microscopy

  • Author/Authors

    S. A. Muller ، نويسنده , , A. Engel، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    11
  • From page
    21
  • To page
    31
  • Keywords
    Electron beam sensitivity , Scanning transmission electron microscope , Mass measurement
  • Journal title
    Micron
  • Serial Year
    2001
  • Journal title
    Micron
  • Record number

    356894

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356894