• Title of article

    Redeposition effects in transmission electron microscope specimens of FeAl–WC composites prepared using a focused ion beam

  • Author/Authors

    J. M. Cairney ، نويسنده , , P. R. Munroe ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    11
  • From page
    97
  • To page
    107
  • Keywords
    transmission electron microscope , Redeposition artifact , Focused ion beam , Specimen preparation
  • Journal title
    Micron
  • Serial Year
    2003
  • Journal title
    Micron
  • Record number

    357061

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=357061