• Title of article

    Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram

  • Author/Authors

    K. Du، نويسنده , , Y.M. Wang، نويسنده , , H. Lichte ، نويسنده , , H.Q. Ye، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    6
  • From page
    67
  • To page
    72
  • Keywords
    Quantitative electron microscopy , Electron holography , high-resolution transmission electron microscopy
  • Journal title
    Micron
  • Serial Year
    2006
  • Journal title
    Micron
  • Record number

    357297

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=357297