Title of article
Atomic force microscopy and the mechanism of fatigue crack growth
Author/Authors
M. Jono، نويسنده , , A. Sugeta ، نويسنده , , Y. Uematsu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
12
From page
831
To page
842
Keywords
Crack branching , imageprocessing technique , Fatigue crack growth , microscopic observation , Mode I , slip deformation , 3% siliconiron. , Atomic Force Microscope
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Serial Year
2001
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Record number
359484
Link To Document