Title of article
Fracture tests of microsized TiAl specimens
Author/Authors
T. P. HALFORD، نويسنده , , K. TAKASHIMA، نويسنده , , Y. Higo، نويسنده , , P. Bowen، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
7
From page
695
To page
701
Keywords
fracture toughness , MEMS , Thinfilm , titanium aluminide.
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Serial Year
2005
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Record number
359871
Link To Document