Title of article
Fatigue and fracture of a Ni–P amorphous alloy thin film on the micrometer scale
Author/Authors
K. TAKASHIMA، نويسنده , , Y. Higo، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
8
From page
703
To page
710
Keywords
Reliability. , microscale testing , MST , durability , Fracture , MEMS , Fatigue
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Serial Year
2005
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Record number
359872
Link To Document