• Title of article

    Characterization of single crystal silicon and electroplated nickel films by uniaxial tensile test with in situ X-ray diffraction measurement

  • Author/Authors

    T. NAMAZU، نويسنده , , S. Inoue and H. Akagi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    8
  • From page
    13
  • To page
    20
  • Keywords
    XRD tensile test , out-of-plane elastic strain , Young’s modulus , Poisson’sratio , single crystal silicon , electroplated nickel , size effect.
  • Journal title
    Fatigue and Fracture of Engineering Materials and Structures
  • Serial Year
    2007
  • Journal title
    Fatigue and Fracture of Engineering Materials and Structures
  • Record number

    360004

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=360004