Title of article
Automating test generation for discrete event oriented embedded systems
Author/Authors
Steven J. Cunning and Jerzy W. Rozenblit ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
26
From page
87
To page
112
Keywords
embedded systems. , Test Pattern Generation , requirements modeling
Journal title
Journal of Intelligent and Robotic Systems
Serial Year
2005
Journal title
Journal of Intelligent and Robotic Systems
Record number
361799
Link To Document