• Title of article

    An Analog Self-Test Based on Differential IDD Monitoring Supported by Differential IOUT Checking

  • Author/Authors

    M. Sidiropulos، نويسنده , , V. Stopjakov?، نويسنده , , H. Manhaeve and V. Musil ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    12
  • From page
    33
  • To page
    44
  • Keywords
    analog circuits - analog self-test - dynamic I DD monitoring - VLSI - CMOS - ASIC
  • Journal title
    Analog Integrated Circuits and Signal Processing
  • Serial Year
    1999
  • Journal title
    Analog Integrated Circuits and Signal Processing
  • Record number

    366995

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=366995