Title of article
Automated System-Level Test Development for Mixed-Signal Circuits
Author/Authors
Sule Ozev and Alex Orailoglu ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
10
From page
169
To page
178
Keywords
analog test , high-level modeling , para metric test , Test coverage
Journal title
Analog Integrated Circuits and Signal Processing
Serial Year
2003
Journal title
Analog Integrated Circuits and Signal Processing
Record number
367315
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