Title of article
Accelerated quasi-DC method and circuit for measuring the gate-drain coupling capacitance for devices within a CMOS process technology
Author/Authors
Manku، نويسنده , , T.; Singh، نويسنده , , G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
5
From page
302
To page
306
Journal title
I E T Circuits, Devices and Systems
Serial Year
1996
Journal title
I E T Circuits, Devices and Systems
Record number
371128
Link To Document