Title of article
Impact of technology scaling on the 1/f noise of thin and thick gate oxide deep submicron NMOS transistors
Author/Authors
Chew، نويسنده , , K.W.; Yeo، نويسنده , , K.S.; Chu، نويسنده , , S.-F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
7
From page
415
To page
421
Journal title
I E T Circuits, Devices and Systems
Serial Year
2004
Journal title
I E T Circuits, Devices and Systems
Record number
371656
Link To Document