Title of article
X–ray spectroscopy as the method of investigation of the electron structure in disordered semiconductors
Author/Authors
V. A. Terekhov، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
4
From page
19
To page
22
Keywords
X-ray spectroscopy , local density of electron states , disordered semiconductors
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
1998
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
379163
Link To Document