• Title of article

    Reliability-Driven Gate Replication for Nanometer-Scale Digital Logic

  • Author/Authors

    Chunhong Chen، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    6
  • From page
    303
  • To page
    308
  • Keywords
    digital logic , gate replication , single-electron tunneling (SET). , Reliability , Redundancy
  • Journal title
    IEEE Transactions on Nanotechnology
  • Serial Year
    2007
  • Journal title
    IEEE Transactions on Nanotechnology
  • Record number

    398942

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=398942