Title of article
X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities
Author/Authors
Mittemeijer، E. J. نويسنده , , Delhez، R. نويسنده , , Keijser، Th. H. de نويسنده , , Velterop، L. نويسنده , , Reefman، D. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
-295
From page
296
To page
0
Abstract
The description of line profiles from f.c.c. metals containing stacking and twin faults, as derived by Warren, has been revised and extended. It is discussed how fault probabilities can be determined from line profiles and it is shown by simulation that the revision leads to significantly better results.
Keywords
Electronic paramagnetic resonance (EPR) , Fullerenes , Chemical synthesis , Organic compounds , Infrared spectroscopy
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year
2000
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number
41901
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