• Title of article

    X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities

  • Author/Authors

    Mittemeijer، E. J. نويسنده , , Delhez، R. نويسنده , , Keijser، Th. H. de نويسنده , , Velterop، L. نويسنده , , Reefman، D. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    -295
  • From page
    296
  • To page
    0
  • Abstract
    The description of line profiles from f.c.c. metals containing stacking and twin faults, as derived by Warren, has been revised and extended. It is discussed how fault probabilities can be determined from line profiles and it is shown by simulation that the revision leads to significantly better results.
  • Keywords
    Electronic paramagnetic resonance (EPR) , Fullerenes , Chemical synthesis , Organic compounds , Infrared spectroscopy
  • Journal title
    JOURNAL OF APPLIED CRYSTALLOGRAPHY
  • Serial Year
    2000
  • Journal title
    JOURNAL OF APPLIED CRYSTALLOGRAPHY
  • Record number

    41901