Title of article
Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings
Author/Authors
Quaeyhaegens، C. نويسنده , , Saerens، A. نويسنده , , Houtte، P. Van نويسنده , , Meert، B. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
-311
From page
312
To page
0
Abstract
The validities of the d-sin2(psi) method, a low incident-beam-angle method and the crystallite-group method are determined for thin titanium nitride coatings, taking the crystallographic texture into account.
Keywords
Fullerenes , Organic compounds , Chemical synthesis , Infrared spectroscopy , Electronic paramagnetic resonance (EPR)
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year
2000
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number
41903
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