Title of article
Whole-profile structure solution from powder diffraction data using simulated annealing
Author/Authors
Coelho، A. A. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
-898
From page
899
To page
0
Abstract
Techniques and methods to facilitate the solution of structures by simulated annealing have been developed from the starting point of a space group and lattice parameters.
Keywords
Organic compounds , Fullerenes , Infrared spectroscopy , Electronic paramagnetic resonance (EPR) , Chemical synthesis
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year
2000
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number
41924
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