Title of article
Resonant X-ray diffraction using high-resolution image-plate data
Author/Authors
Hartmann، T. نويسنده , , Ehrenberg، H. نويسنده , , Knapp، M. نويسنده , , Fuess، H. نويسنده , , Wroblewski، T. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
-952
From page
953
To page
0
Abstract
A setup for synchrotron X-ray powder diffraction on samples with high absorption ((mu)R > 10) is described.
Keywords
Fullerenes , Organic compounds , Chemical synthesis , Infrared spectroscopy , Electronic paramagnetic resonance (EPR)
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Serial Year
2000
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Record number
41931
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