• Title of article

    Ellipsometry in the Study of Dynamic Material Properties

  • Author/Authors

    A. W. Obst، نويسنده , , K. R. Alrick، نويسنده , , K. Boboridis، نويسنده , , W. T. Buttler، نويسنده , , B. R. Marshall، نويسنده , , J. R. Payton and M. D. Wilke ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    8
  • From page
    1259
  • To page
    1266
  • Abstract
    Measurements of the time-dependent absolute temperature of surfaces shocked using high explosives (HE) provide valuable constraints on the equations-ofstate (EOS) of materials and on the state of ejecta from those surfaces. In support of these dynamic surface temperature measurements, techniques for measuring the dynamic surface emissivity of shocked metals in the near infrared (IR) are being developed. These consist of time-dependent laser ellipsometric measurements, using several approaches. A discussion of these ellipsometric techniques is included here. Ellipsometry permits an accurate determination of the dynamic emissivity at a given wavelength, and may also provide a signature of melt in shocked metals.
  • Keywords
    ellipsometry , Emissivity , pyrometry. , Infrared
  • Journal title
    International Journal of Thermophysics
  • Serial Year
    2002
  • Journal title
    International Journal of Thermophysics
  • Record number

    426903