Title of article
Ellipsometry in the Study of Dynamic Material Properties
Author/Authors
A. W. Obst، نويسنده , , K. R. Alrick، نويسنده , , K. Boboridis، نويسنده , , W. T. Buttler، نويسنده , , B. R. Marshall، نويسنده , , J. R. Payton and M. D. Wilke ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
8
From page
1259
To page
1266
Abstract
Measurements of the time-dependent absolute temperature of surfaces shocked
using high explosives (HE) provide valuable constraints on the equations-ofstate
(EOS) of materials and on the state of ejecta from those surfaces. In
support of these dynamic surface temperature measurements, techniques for
measuring the dynamic surface emissivity of shocked metals in the near infrared
(IR) are being developed. These consist of time-dependent laser ellipsometric
measurements, using several approaches. A discussion of these ellipsometric
techniques is included here. Ellipsometry permits an accurate determination of
the dynamic emissivity at a given wavelength, and may also provide a signature
of melt in shocked metals.
Keywords
ellipsometry , Emissivity , pyrometry. , Infrared
Journal title
International Journal of Thermophysics
Serial Year
2002
Journal title
International Journal of Thermophysics
Record number
426903
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