Title of article
Measurement of Thermal Conductivity of TiO2 Thin Films Using 3ω Method
Author/Authors
D.J. Kim، نويسنده , , D.S. Kim، نويسنده , , S. Cho، نويسنده , , S.W. Kim، نويسنده , , S.H. Lee and J.C. Kim ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
9
From page
281
To page
289
Abstract
TiO2 film has been used in many industrial components such as laser filters,
protection mirrors, chemical sensors, and optical catalysts. Therefore, the
thermal properties of TiO2 thin films are important in, e.g., reducing the thermal
conductivity of ceramic coatings in gas turbines and increasing the laser damage
threshold of antireflection coatings. The thermal conductivity of four kinds of
TiO2 thin films, prepared by dc magnetron sputtering, was measured using the
3w method in the temperature range from 80 K to room temperature. The
results showed that the thermal conductivity of TiO2 thin films strongly depends
on the thickness and the microstructure of the films. The films with smaller
grain size and thinner thickness have smaller thermal conductivities
Keywords
3w method , Thinfilm , TiO2 film. , thermal conductivity , thermal resistance
Journal title
International Journal of Thermophysics
Serial Year
2004
Journal title
International Journal of Thermophysics
Record number
427048
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