• Title of article

    Measurement of Thermal Conductivity of TiO2 Thin Films Using 3ω Method

  • Author/Authors

    D.J. Kim، نويسنده , , D.S. Kim، نويسنده , , S. Cho، نويسنده , , S.W. Kim، نويسنده , , S.H. Lee and J.C. Kim ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    9
  • From page
    281
  • To page
    289
  • Abstract
    TiO2 film has been used in many industrial components such as laser filters, protection mirrors, chemical sensors, and optical catalysts. Therefore, the thermal properties of TiO2 thin films are important in, e.g., reducing the thermal conductivity of ceramic coatings in gas turbines and increasing the laser damage threshold of antireflection coatings. The thermal conductivity of four kinds of TiO2 thin films, prepared by dc magnetron sputtering, was measured using the 3w method in the temperature range from 80 K to room temperature. The results showed that the thermal conductivity of TiO2 thin films strongly depends on the thickness and the microstructure of the films. The films with smaller grain size and thinner thickness have smaller thermal conductivities
  • Keywords
    3w method , Thinfilm , TiO2 film. , thermal conductivity , thermal resistance
  • Journal title
    International Journal of Thermophysics
  • Serial Year
    2004
  • Journal title
    International Journal of Thermophysics
  • Record number

    427048