• Title of article

    Alpha 21164 Testability Strategy

  • Author/Authors

    Dilip K. Bhavsar John H. Edmondson ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1997
  • Pages
    9
  • From page
    25
  • To page
    33
  • Abstract
    A custom DFT strategy solved specific testability and manufacturing issues for this high performance microprocessor. Hardware and software assisted self test and self repair features helped meet aggressive schedule and manufacturing quality and cost goals
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1997
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431122

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431122