Title of article
IC Failure Analysis: Magic, Mystery, and Science
Author/Authors
Jerry M. Soden، نويسنده , , Richard E. Anderson، نويسنده , , Chris L. Henderson ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
11
From page
59
To page
69
Abstract
Advancing IC and packaging technologies motivate and direct the future of failure analysis. The authors review current tools and techniques and discuss challenges and opportunities created by the industryʹs critical need for new diagnosis and failure analysis paradigms
Journal title
IEEE Design and Test of Computers
Serial Year
1997
Journal title
IEEE Design and Test of Computers
Record number
431148
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