Title of article
IC Failure Analysis: The Importance of Test and Diagnostics
Author/Authors
David P. Vallett، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
7
From page
76
To page
82
Abstract
Continuous improvements in yield, reliability, time to market, and customer satisfaction all benefit from quick corrective action through root-cause failure analysis. The author reviews software- and hardware-based diagnostic methods for fault localization, the first and most critical step in this process
Journal title
IEEE Design and Test of Computers
Serial Year
1997
Journal title
IEEE Design and Test of Computers
Record number
431150
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