Title of article
Control and Observation Structures for Analog Circuits
Author/Authors
Yeong-Ruey Shieh Cheng-Wen Wu ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
9
From page
56
To page
64
Abstract
No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. This paper provides an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy
Journal title
IEEE Design and Test of Computers
Serial Year
1998
Journal title
IEEE Design and Test of Computers
Record number
431185
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