• Title of article

    Testing NASAʹs 3D-Stack MCM Space Flight Computer

  • Author/Authors

    Koppol Sasidhar Leon Alkalai Abhijit Chatterjee ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    12
  • From page
    44
  • To page
    55
  • Abstract
    Advanced packaging technologies pose major testing challenges for complex designs. The authors present test strategies used in the space flight computer designed for NASAʹs Deep Space-1 mission
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1998
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431196

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431196