Title of article
Testing the 500-MHz IBM S/390 Microprocessor
Author/Authors
Thomas G. Foote، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
7
From page
83
To page
89
Abstract
The design-for-test framework of the 500-MHz CMOS central processor uses specific tests to ensure the highest reliability of components within a system. Some of the same test patterns are applied in chip manufacturing and system-level tests
Journal title
IEEE Design and Test of Computers
Serial Year
1998
Journal title
IEEE Design and Test of Computers
Record number
431202
Link To Document