Title of article
Effective Built-In Self-Test for Booth Multipliers
Author/Authors
Dimitris Gizopoulos، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
7
From page
105
To page
111
Abstract
Booth multipliers, widely used as embedded cores in general-purpose data path structures and specialized digital signal processors, pose serious testability problems. This generic BIST scheme does not require DFT modifications in the multiplier structure, guarantees fault coverage higher than 99%, and can be adopted by any module generator
Journal title
IEEE Design and Test of Computers
Serial Year
1998
Journal title
IEEE Design and Test of Computers
Record number
431205
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