• Title of article

    Test and Reliability: Partners in IC Manufacturing, Part 1

  • Author/Authors

    Charles F. Hawkins Jaume Segura ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    8
  • From page
    64
  • To page
    71
  • Abstract
    This article explains the major IC reliability failure mechanisms with perspectives on their severity and relation to test
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1999
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431244

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431244