• Title of article

    Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops

  • Author/Authors

    Keith A. Jenkins James P. Eckhardt ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    8
  • From page
    86
  • To page
    93
  • Abstract
    The use of phase-locked loops (PLLs) for clock generation in modern microprocessors has been proliferating in recent years. This is because PLLs have the advantages of allowing multiplication of the reference clock frequency and allowing phase alignment between chips. The PLL locks to a reference clock but can generate output clocks that are a multiple of the reference. It is argued that excessive “jitter”, caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured-not just the jitter
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2000
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431281