Title of article
Collection and Analysis of Microprocessor Design Errors
Author/Authors
David Van Campenhout Trevor Mudge John P. Hayes ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
10
From page
51
To page
60
Abstract
Research on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort
Journal title
IEEE Design and Test of Computers
Serial Year
2000
Journal title
IEEE Design and Test of Computers
Record number
431308
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