• Title of article

    Economics of Built-in Self-Tes

  • Author/Authors

    Louis Y. Ungar Tony Ambler ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    10
  • From page
    70
  • To page
    79
  • Abstract
    Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2001
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431358

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431358