Title of article
Guest Editorsʹ Introduction: Defect-Oriented Testing in the Deep-Submicron Era
Author/Authors
Jaume Segura Peter Maxwell ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
3
From page
5
To page
7
Journal title
IEEE Design and Test of Computers
Serial Year
2002
Journal title
IEEE Design and Test of Computers
Record number
431408
Link To Document