• Title of article

    Extending OPMISR beyond 10x Scan Test Efficiency

  • Author/Authors

    Carl Barnhart، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    8
  • From page
    65
  • To page
    72
  • Abstract
    Rapidly increasing ASIC gate counts are stressing the test capacity of manufacturing test equipment. New on-product multiple-input signature register (OPMISR) techniques compress test vectors produced by ATPG, substantially reducing data volume and test time
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2002
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431416

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431416