Title of article
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort
Author/Authors
W. Robert Daasch، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
8
From page
74
To page
81
Abstract
To screen defective dies, IDDQ tests require a reliable estimate of each dieʹs defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers
Journal title
IEEE Design and Test of Computers
Serial Year
2002
Journal title
IEEE Design and Test of Computers
Record number
431417
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