Title of article
Seamless Test of Digital Components in Mixed-Signal Paths
Author/Authors
Sule Ozev، نويسنده , , Duke University Ismet Bayraktaroglu، نويسنده , , Sun Microsystems Alex Orailoglu، نويسنده , , University of California، نويسنده , , San Diego ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
12
From page
44
To page
55
Abstract
For todayʹs large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. We offer an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.
Journal title
IEEE Design and Test of Computers
Serial Year
2004
Journal title
IEEE Design and Test of Computers
Record number
431468
Link To Document