• Title of article

    Enhanced Equivalence Checking: Toward a Solidarity of Functional Verification and Manufacturing Test Generation

  • Author/Authors

    Jayanta Bhadra، نويسنده , , Freescale Semiconductor Narayanan Krishnamurthy، نويسنده , , Freescale Semiconductor Magdy S. Abadir، نويسنده , , Freescale Semiconductor ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    9
  • From page
    494
  • To page
    502
  • Abstract
    This article, from the Motorola (now Freescale) PowerPC design group, presents an interesting synergy among test, equivalence verification, and constraints. The authors use RTL, gate, and switch models of a design in two different flows one for test and one for functional verification to show that rectifying constraints and merging tests between the-two flows saves significant presilicon debug effort.
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2004
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431535