Title of article
Enhanced Equivalence Checking: Toward a Solidarity of Functional Verification and Manufacturing Test Generation
Author/Authors
Jayanta Bhadra، نويسنده , , Freescale Semiconductor Narayanan Krishnamurthy، نويسنده , , Freescale Semiconductor Magdy S. Abadir، نويسنده , , Freescale Semiconductor ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
9
From page
494
To page
502
Abstract
This article, from the Motorola (now Freescale) PowerPC design group, presents an interesting synergy among test, equivalence verification, and constraints. The authors use RTL, gate, and switch models of a design in two different flows one for test and one for functional verification to show that rectifying constraints and merging tests between the-two flows saves significant presilicon debug effort.
Journal title
IEEE Design and Test of Computers
Serial Year
2004
Journal title
IEEE Design and Test of Computers
Record number
431535
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